An Aging-resistant Ro-puf For Reliable Key Generation

Posted : admin On 15.04.2020

An Aging-Resistant RO-PUF for Reliable Key Generation Article in IEEE Transactions on Emerging Topics in Computing 99(3) September 2015 with 89 Reads How we measure 'reads'. Windows 7 ultimate service pack 1 product key generator. Free Online Library: Design Impedance Mismatch Physical Unclonable Functions for IoT Security.(Research Article, Internet of Things, Report) by 'Active and Passive Electronic Components'; Engineering and manufacturing Amplifiers Design and construction Amplifiers (Electronics) Circuit design Methods Circuit printing Analysis Data security Impedance (Electricity) Control Internet of things.


Reconfigurable unique key generation using variable duty cycle PUF. Authentication and secret key generation. Tehranipoor, M.: An aging-resistant RO-PUF for. Bibliographic content of IEEE Transactions on Emerging Topics in Computing, Volume 4.

  1. Tehranipoor, 'Systematic Correlation and Cell Neighborhood Analysis of SRAM-PUF for Robust and Unique Key Generation,' in Journal of Hardware and Systems Security (HaSS), 2017 (in press).
  2. An Aging-Resistant RO-PUF for Reliable Key Generation. Simulation results demonstrate that our aging-resistant RO-PUF (ARO-PUF) can produce unique, random, and more reliable keys.
  3. An aging-resistant RO-PUF for reliable key generation MT Rahman, F Rahman, D Forte, M Tehranipoor IEEE Transactions on Emerging Topics in Computing 4 (3), 335-348, 2015.
B2.M. T. Rahman, D. Forte, M. Tehranipoor, 'Protection of Assets from Scan Chain Vulnerabilities through Obfuscation,' in Hardware Protection through Obfuscation by Domenic Forte, Swarup Bhunia, and Mark M. Tehranipoor, Springer, 2017.
B1.M. T. Rahman, 'Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly' in Counterfeit Integrated Circuits: Detection and Avoidance, Springer, 2015.
Journals:
J4.Z. Guo, X. Xu, M. T. Rahman, M. Tehranipoor, D. Forte, 'SCARe: An SRAM-based Countermeasure Against IC Recycling,' IEEE Transactions on Very Large Scale Integration Systems, 2017 (in press).
J3. M.T. Rahman, A. Hosey, Z. Guo, D. Forte, M. Tehranipoor, 'Systematic Correlation and Cell Neighborhood Analysis of SRAM-PUF for Robust and Unique Key Generation,' in Journal of Hardware and Systems Security (HaSS), 2017 (in press).
J2. M.T. Rahman, F. Rahman, D. Forte, M. Tehranipoor, 'An Aging-Resistant RO-PUF for Reliable Key Generation,' IEEE Transactions on Emerging Topics in Computing (TETC), 2015.
J1.A. Mazady, M.T. Rahman, D. Forte, M. Anwar, 'Memristor Nano-PUF A Security Primitive: Theory and Experiment,' in IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS).


C17. M. T. Rahman, D. Forte, and M. Tehranipoor, 'SRAM Inspired Design and Optimization for Developing Robust Security Primitives,' in SRC TECHCON, September 2016. [Awarded Best in Session]

An Aging-resistant Ro-puf For Reliable Key Generation 2017

C16.Z. Guo, M. T. Rahman, M. Tehranipoor, D. Forte, 'A Zero-cost Approach to Detect Recycled SoCs Using Embedded SRAM', Hardware-Oriented Security and Trust (HOST) 2016, May 2016.
C15. M. T. Rahman, D. Forte, X. Wang, M. Tehranipoor, 'Enhancing Noise Sensitivity of Embedded SRAMs for Robust True Random Number Generation in SoCs,' IEEE Asian Hardware-Oriented Security and Trust (AsianHOST), Dec. 2016.
C14. M. T. Rahman, D. Forte, F. Rahman, M. Tehranipoor, 'A Pair Selection Algorithm for Robust RO-PUF Against Environmental Variations and Aging,' to appear IEEE International Conference on Computer Design (ICCD), Oct. 2015.
C13. M. T. Rahman, D. Forte, and M. Tehranipoor, 'Robust SRAM-PUF: Cell Stability Analysis and Novel Bit-Selection Algorithm,'TECHCON, 2015.
C12. M. T. Rahman, A. Hosey, K. Xiao, D. Forte, and M. Tehranipoor, 'Cell Stability Analysis and Novel Bit-Selection Algorithm for Robust SRAM-PUF,'Connecticut Microelectronic Symposium (CMOC), 2015.
C11. N. Karimianbahnemiri, F. Tehranipoor, M.T. Rahman, D. Forte, 'Genetic Algorithm for Hardware Trojan Detection with Ring Oscillator Network (RON),' IEEE International Conference on Technologies for Homeland Security (HST), April 2015.
C10. M.T. Rahman, A. Hosey, F. Rahman, D. Forte, M. Tehranipoor, 'RePa: A Pair Selection Algorithm for Reliable Keys from RO-based PUF' to appear GOMACTech, March 2015.
Key
C9. A. Hosey, M.T. Rahman, K. Xiao, D. Forte, M. Tehranipoor, 'Advanced Analysis of Cell Stability for Reliable SRAM PUF,' to appear IEEE Asian Test Symposium (ATS), November 2014.
C8. M.T. Rahman, D. Forte, Q. Shi, G. Contreras, M. Tehranipoor, 'CSST: Preventing Distribution of Unlicensed and Rejected ICs by Untrusted Foundry and Assembly,' IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct. 2014.
C7. M.T. Rahman, K. Xiao, D. Forte, X. Zhang, Z. Shi, M. Tehranipoor, 'TI-TRNG: Technology Independent True Random Number Generator,' Design Automation Conference (DAC), June 2014 (Richard Newton Young Student Fellow).
C6. M.T. Rahman, D. Forte, Q. Shi, G. Contreras, M. Tehranipoor, 'CSST: An Efficient Secure Split-Test for Preventing IC Piracy,' IEEE North Atlantic Test Workshop (NATW), May 2014.
C5. K. Xiao, M.T. Rahman, D. Forte, M. Su, Y. Huang, M.Tehranipoor, 'Bit Selection Algorithm Suitable for High-Volume Production of SRAM-PUF,' in Hardware-Oriented Security and Trust (HOST), May 2014.
C4. M.T. Rahman, D. Forte, J. Fahrny, M. Tehranipoor, 'ARO-PUF: An Aging-Resistant Ring Oscillator PUF Design,' Design, Automation, & Test in Europe (DATE), March 2014.
C3.Kan Xiao, Md. Tauhidur Rahman, Domenic Forte, and M. Tehranipoor, 'Low-cost Analysis of SRAM PUFs for Identification of Mass-Produced Electronic Devices' -GOMACTech-2014.
C2.G. Contreras, Md. Tauhidur Rahman, and M. Tehranipoor, 'Secure Split-Test for Preventing IC Piracy by Untrusted Foundry and Assembly,'Int. Symposium on Defect and Fault Tolerance in VLSI Systems (DFT),2-4 October, 2013, NY.
C1. MM Hasan, MT Rahman, MN Hasan, A Rashid, and AR Patwary , 'A Novel Match-line Charging Control Scheme with a New Sense Amplifier for High-Speed and Low-Power Content-Addressable Memory,' inSolid State and Device Materials, Japan-2008.

Patents:
P1: M. Tehranipoor, M. Tauhidur Rahman, AND D. f, 'Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly' UNTED STATES PATENT.(PENDING)
Aging-resistant

An Aging-resistant Ro-puf For Reliable Key Generation Car


An Aging-resistant Ro-puf For Reliable Key Generation Computer


An Aging-resistant Ro-puf For Reliable Key Generation 7


1. 'Aging-Resistant Ring Oscillator PUF Design' ARO/CHASE SPECIAL WORKSHOP ON COUNTERFEIT ELECTRONICS, UNIVERSITY OF CONNECTICUT, Jan 2013.



An Aging-resistant Ro-puf For Reliable Key Generation Car